Abstract is missing.
- Keynote Address: Soft Ware for Hard PhysicsSteve Shafer. 1-2
- Medium Size Project Model: Variations on a ThemePeter J. Knoke. 5-24
- A Controlled Software Maintenance ProjectFrank W. Calliss, Debra L. Trantina. 25-32
- Models for Undergraduate Project Courses in Software EngineeringMary Shaw, James E. Tomayko. 33-71
- The Establishment of an Appropriate Software Engineering Training ProgramR. D. Kelly, D. L. Lapay, F. S. Pitcairn. 75-98
- Industrial Training for Software EngineersP. Mann, A. Mason, M. T. Norris. 99-113
- Software Engineering: Graduate-Level Courses for AFIT Professional Continuing EducationNancy R. Mead, Patricia K. Lawlis. 114-126
- Computing Curricula 1991 - Its Implications for Software Engineering EducationBruce H. Barnes, Jean B. Rogers. 129-147
- Computer Based Systems Engineering WorkshopJonah Z. Lavi, Ashok K. Agrawala, Raymond J. A. Buhr, Ken Jackson, Michael Jackson, Bernard Lang. 149-163
- Teaching about Process Issues in Software EngineeringDavid Budgen, Chic Rattray. 167-180
- A Layered Approach to Teaching Software Project ManagementDavid W. Bustard. 181-191
- Seven Lessons to Teach DesignJ.-P. Jacquot, J. Guyard. 195-204
- Design Evolution: Implications for Academia and IndustryLinda M. Northrop, William E. Richardson. 205-217
- Teaching Software Design in the Freshman YearKeith R. Pierce, Linda L. Deneen, Gary M. Shute. 219-231
- Teaching Software Engineering for Real-Time DesignConni Goodman Marchewka. 235-244
- Industry-Academia Collaboration to Provide CASE Tools for Software Engineering ClassesLaurie Honour Werth. 245-256
- Developing SE ExpertiseJulian S. Weitzenfeld. 259-260
- What We Have Learned About Software Engineering ExpertiseThomas R. Riedl, Julian S. Weitzenfeld, Jared T. Freeman, Gary A. Klein, John D. Musa. 261-270
- Instruction for Software Engineering ExpertiseJared T. Freeman, Thomas R. Riedl, Julian S. Weitzenfeld, Gary A. Klein, John D. Musa. 271-282
- Knowledge Elicitation for Software Engineering ExpertiseJulian S. Weitzenfeld, Thomas R. Riedl, Jared T. Freeman, Gary A. Klein, John D. Musa. 283-296