Vincenzo d'Alessandro, Alessandro Magnani, Lorenzo Codecasa, Niccolò Rinaldi, Klaus Aufinger. Advanced thermal simulation of SiGe: C HBTs including back-end-of-line. Microelectronics Reliability, 67:38-45, 2016. [doi]
@article{dAlessandroMCRA16,
title = {Advanced thermal simulation of SiGe: C HBTs including back-end-of-line},
author = {Vincenzo d'Alessandro and Alessandro Magnani and Lorenzo Codecasa and Niccolò Rinaldi and Klaus Aufinger},
year = {2016},
doi = {10.1016/j.microrel.2016.06.005},
url = {http://dx.doi.org/10.1016/j.microrel.2016.06.005},
researchr = {https://researchr.org/publication/dAlessandroMCRA16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {67},
pages = {38-45},
}