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Mustererkennung 1995, 17. DAGM-Symposium, Bielefeld, 13.-15. September 1995, Proceedings

Gerhard Sagerer, Stefan Posch, Franz Kummert, editors, Mustererkennung 1995, 17. DAGM-Symposium, Bielefeld, 13.-15. September 1995, Proceedings. Informatik Aktuell, Springer, 1995.

Conference: dagm1995

Editors

Gerhard Sagerer

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Stefan Posch

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Franz Kummert

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