Maksim Jenihhin, Hana Kubátová, Nele Metens, Jaan Raik, Foisal Ahmed, Jan Belohoubek, editors, 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023, Tallinn, Estonia, May 3-5, 2023. IEEE, 2023. [doi]
Conference: ddecs2023
@proceedings{ddecs-2023,
title = {26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023, Tallinn, Estonia, May 3-5, 2023},
year = {2023},
doi = {10.1109/DDECS57882.2023},
url = {https://doi.org/10.1109/DDECS57882.2023},
researchr = {https://researchr.org/publication/ddecs-2023},
cites = {0},
citedby = {0},
booktitle = {26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023, Tallinn, Estonia, May 3-5, 2023},
conference = {ddecs},
editor = {Maksim Jenihhin and Hana Kubátová and Nele Metens and Jaan Raik and Foisal Ahmed and Jan Belohoubek},
publisher = {IEEE},
isbn = {979-8-3503-3277-3},
}