25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010

25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. IEEE Computer Society, 2010. [doi]

Conference: dft2010

@proceedings{dft-2010,
  title = {25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010},
  year = {2010},
  url = {http://www.computer.org/csdl/proceedings/dft/2010/4243/00/index.html},
  researchr = {https://researchr.org/publication/dft-2010},
  cites = {0},
  citedby = {0},
  booktitle = {25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010},
  conference = {dft},
  publisher = {IEEE Computer Society},
  isbn = {978-1-4244-8447-8},
}