2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012. IEEE Computer Society, 2012. [doi]
Conference: dft2012
@proceedings{dft-2012,
title = {2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012},
year = {2012},
url = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6362314},
researchr = {https://researchr.org/publication/dft-2012},
cites = {0},
citedby = {0},
booktitle = {2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012},
conference = {dft},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-3043-5},
}