David Zhang 0001, Gautam Sethi, Raymond N. J. Veldhuis, Yasushi Yagi, Andrew Beng Jin Teoh, editors, Proceedings of the 2017 International Conference on Biometrics Engineering and Application, ICBEA 2018, Hong Kong, Hong Kong, April 21 - 23, 2017. ACM, 2017. [doi]
Conference: icbea2017
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