Proceedings of the 2017 International Conference on Biometrics Engineering and Application, ICBEA 2018, Hong Kong, Hong Kong, April 21 - 23, 2017

David Zhang 0001, Gautam Sethi, Raymond N. J. Veldhuis, Yasushi Yagi, Andrew Beng Jin Teoh, editors, Proceedings of the 2017 International Conference on Biometrics Engineering and Application, ICBEA 2018, Hong Kong, Hong Kong, April 21 - 23, 2017. ACM, 2017. [doi]

Conference: icbea2017

Abstract

Abstract is missing.

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