David Christie, Alan Lee, Onur Mutlu, Benjamin G. Zorn, editors, 4th International Symposium on Workload Characterization (IISWC 2008), Seattle, Washington, USA, September 14-16, 2008. IEEE, 2008.
Conference: iiswc2008
@proceedings{iiswc:2008,
title = {4th International Symposium on Workload Characterization (IISWC 2008), Seattle, Washington, USA, September 14-16, 2008},
year = {2008},
researchr = {https://researchr.org/publication/iiswc%3A2008},
cites = {0},
citedby = {0},
booktitle = {4th International Symposium on Workload Characterization (IISWC 2008), Seattle, Washington, USA, September 14-16, 2008},
conference = {iiswc},
editor = {David Christie and Alan Lee and Onur Mutlu and Benjamin G. Zorn},
publisher = {IEEE},
isbn = {978-1-4244-2778-9},
}