2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006

Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. IEEE, 2006. [doi]

Conference: itc2006

Editors

Scott Davidson

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Anne Gattiker

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