Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. IEEE, 2009. [doi]
Conference: itc2009
@proceedings{itc-2009,
title = {2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009},
year = {2009},
url = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5348788},
researchr = {https://researchr.org/publication/itc-2009},
cites = {0},
citedby = {0},
booktitle = {2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009},
conference = {itc},
editor = {Gordon W. Roberts and Bill Eklow},
publisher = {IEEE},
isbn = {978-1-4244-4868-5},
}