Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. IEEE, 2010. [doi]
Conference: itc2010
@proceedings{itc-2010,
title = {2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010},
year = {2010},
url = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5684496},
researchr = {https://researchr.org/publication/itc-2010},
cites = {0},
citedby = {0},
booktitle = {2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010},
conference = {itc},
editor = {Ron Press and Erik H. Volkerink},
publisher = {IEEE},
isbn = {978-1-4244-7206-2},
}