Ren junling. Multi-order Standard Deviation Based Distance Metrics and its Application in Handwritten Chinese Character Recognition. In 18th International Conference on Pattern Recognition (ICPR 2006), 20-24 August 2006, Hong Kong, China. pages 1114-1117, IEEE Computer Society, 2006. [doi]
@inproceedings{junling06,
title = {Multi-order Standard Deviation Based Distance Metrics and its Application in Handwritten Chinese Character Recognition},
author = {Ren junling},
year = {2006},
doi = {10.1109/ICPR.2006.828},
url = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2006.828},
tags = {rule-based},
researchr = {https://researchr.org/publication/junling06},
cites = {0},
citedby = {0},
pages = {1114-1117},
booktitle = {18th International Conference on Pattern Recognition (ICPR 2006), 20-24 August 2006, Hong Kong, China},
publisher = {IEEE Computer Society},
isbn = {0-7695-2521-0},
}