Condition Monitoring of a IC Engine Fault Diagnosis using Machine Learning and Neural Network Techniques

P. Naveen Kumar, G. Sakthivel, R. Jagadeeshwaran, D. Saravanakumar 0002. Condition Monitoring of a IC Engine Fault Diagnosis using Machine Learning and Neural Network Techniques. In IEEE International Symposium on Smart Electronic Systems, iSES 2020 (Formerly iNiS), Chennai, India, December 14-16, 2020. pages 183-189, IEEE, 2020. [doi]

Authors

P. Naveen Kumar

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G. Sakthivel

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R. Jagadeeshwaran

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D. Saravanakumar 0002

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