P. Naveen Kumar, G. Sakthivel, R. Jagadeeshwaran, D. Saravanakumar 0002. Condition Monitoring of a IC Engine Fault Diagnosis using Machine Learning and Neural Network Techniques. In IEEE International Symposium on Smart Electronic Systems, iSES 2020 (Formerly iNiS), Chennai, India, December 14-16, 2020. pages 183-189, IEEE, 2020. [doi]
@inproceedings{kumarSJ020,
title = {Condition Monitoring of a IC Engine Fault Diagnosis using Machine Learning and Neural Network Techniques},
author = {P. Naveen Kumar and G. Sakthivel and R. Jagadeeshwaran and D. Saravanakumar 0002},
year = {2020},
doi = {10.1109/iSES50453.2020.00048},
url = {https://doi.org/10.1109/iSES50453.2020.00048},
researchr = {https://researchr.org/publication/kumarSJ020},
cites = {0},
citedby = {0},
pages = {183-189},
booktitle = {IEEE International Symposium on Smart Electronic Systems, iSES 2020 (Formerly iNiS), Chennai, India, December 14-16, 2020},
publisher = {IEEE},
isbn = {978-1-6654-0478-5},
}