The following publications are possibly variants of this publication:
- Edge-Coupled Active and Passive Wafer-Scale Measurements on 300mm Silicon Photonics WafersKenneth M. Jabon, Christopher V. Poulton, Ren-Jye Shiue, Matthew J. Byrd, Zhan Su 0001, Mohammad H. Teimourpour, Scott Breitenstein, Ronald P. Millman, Dogan A. Atlas, Michael R. Watts, Erman Timurdogan. ofc 2021: 1-3 [doi]