Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2004, June 10-14, 2004, New York, NY, USA

Edward G. Coffman Jr., Zhen Liu, Arif Merchant, editors, Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2004, June 10-14, 2004, New York, NY, USA. ACM, 2004.

Conference: sigmetrics2004

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