Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2004, June 10-14, 2004, New York, NY, USA

Edward G. Coffman Jr., Zhen Liu, Arif Merchant, editors, Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2004, June 10-14, 2004, New York, NY, USA. ACM, 2004.

Conference: sigmetrics2004

@proceedings{sigmetrics:2004,
  title = {Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2004, June 10-14, 2004,  New York, NY, USA},
  year = {2004},
  tags = {modeling},
  researchr = {https://researchr.org/publication/sigmetrics%3A2004},
  cites = {0},
  citedby = {0},
  booktitle = {Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2004, June 10-14, 2004,  New York, NY, USA},
  conference = {sigmetrics},
  editor = {Edward G. Coffman Jr. and Zhen Liu and Arif Merchant},
  publisher = {ACM},
  isbn = {1-58113-873-3},
}