Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2005, June 6-10, 2005, Banff, Alberta, Canada - researchr publication authors

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Derek L. Eager, Carey L. Williamson, Sem C. Borst, John C. S. Lui, editors, Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2005, June 6-10, 2005, Banff, Alberta, Canada. ACM, 2005.

Conference: sigmetrics2005

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