Derek L. Eager, Carey L. Williamson, Sem C. Borst, John C. S. Lui, editors, Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2005, June 6-10, 2005, Banff, Alberta, Canada. ACM, 2005.
Conference: sigmetrics2005
@proceedings{sigmetrics:2005,
title = {Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2005, June 6-10, 2005, Banff, Alberta, Canada},
year = {2005},
tags = {modeling},
researchr = {https://researchr.org/publication/sigmetrics%3A2005},
cites = {0},
citedby = {0},
booktitle = {Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2005, June 6-10, 2005, Banff, Alberta, Canada},
conference = {sigmetrics},
editor = {Derek L. Eager and Carey L. Williamson and Sem C. Borst and John C. S. Lui},
publisher = {ACM},
isbn = {1-59593-022-1},
}