Proceedings of the 1992 ACM SIGMETRICS joint international conference on Measurement and modeling of computer systems, Newport, Rhode Island, USA, June 1-5, 1992

Michael K. Molloy, Blaine D. Gaither, editors, Proceedings of the 1992 ACM SIGMETRICS joint international conference on Measurement and modeling of computer systems, Newport, Rhode Island, USA, June 1-5, 1992. ACM, 1992. [doi]

Conference: sigmetrics1992

Abstract

Abstract is missing.