Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma, editors, VLSI Design and Test - 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers. Volume 1066 of Communications in Computer and Information Science, Springer, 2019. [doi]
Conference: vdat2019
@proceedings{vdat-2019,
title = {VLSI Design and Test - 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers},
year = {2019},
doi = {10.1007/978-981-32-9767-8},
url = {https://doi.org/10.1007/978-981-32-9767-8},
researchr = {https://researchr.org/publication/vdat-2019},
cites = {0},
citedby = {0},
booktitle = {VLSI Design and Test - 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers},
conference = {vdat},
editor = {Anirban Sengupta and Sudeb Dasgupta and Virendra Singh and Rohit Sharma and Santosh Kumar Vishvakarma},
volume = {1066},
series = {Communications in Computer and Information Science},
publisher = {Springer},
isbn = {978-981-32-9767-8},
}