Youngsoo Shin, Chi-Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis, editors, VLSI-SoC: Design for Reliability, Security, and Low Power - 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers. Volume 483 of IFIP Advances in Information and Communication Technology, Springer, 2016. [doi]
Conference: vlsi2016
@proceedings{vlsi-2015socs,
title = {VLSI-SoC: Design for Reliability, Security, and Low Power - 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers},
year = {2016},
doi = {10.1007/978-3-319-46097-0},
url = {http://dx.doi.org/10.1007/978-3-319-46097-0},
researchr = {https://researchr.org/publication/vlsi-2015socs},
cites = {0},
citedby = {0},
booktitle = {VLSI-SoC: Design for Reliability, Security, and Low Power - 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers},
conference = {vlsi},
editor = {Youngsoo Shin and Chi-Ying Tsui and Jae-Joon Kim and Kiyoung Choi and Ricardo Reis},
volume = {483},
series = {IFIP Advances in Information and Communication Technology},
publisher = {Springer},
isbn = {978-3-319-46096-3},
}