19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. IEEE Computer Society, 2001.
Conference: vts2001
@proceedings{vts:2001,
title = {19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA},
year = {2001},
tags = {testing},
researchr = {https://researchr.org/publication/vts%3A2001},
cites = {0},
citedby = {0},
booktitle = {19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA},
conference = {vts},
publisher = {IEEE Computer Society},
isbn = {0-7695-1122-8},
}