31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. IEEE Computer Society, 2013. [doi]
Conference: vts2013
@proceedings{vts-2013,
title = {31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013},
year = {2013},
url = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6530960},
researchr = {https://researchr.org/publication/vts-2013},
cites = {0},
citedby = {0},
booktitle = {31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013},
conference = {vts},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-5542-1},
}