33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. IEEE, 2015. [doi]
Conference: vts2015
@proceedings{vts-2015,
title = {33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015},
year = {2015},
url = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7104933},
researchr = {https://researchr.org/publication/vts-2015},
cites = {0},
citedby = {0},
booktitle = {33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015},
conference = {vts},
publisher = {IEEE},
isbn = {978-1-4799-7597-6},
}