Abstract is missing.
- TPC's Benchmark Development Model: Making the First Industry Standard Benchmark on Big Data a SuccessMeikel Poess. 1-10 [doi]
- Data Management - A Look Back and a Look AheadRaghunath Nambiar, Ramesh Chitor, Ashok Joshi. 11-19 [doi]
- Big Data GenerationTilmann Rabl, Hans-Arno Jacobsen. 20-27 [doi]
- From TPC-C to Big Data Benchmarks: A Functional Workload ModelYanpei Chen, Francois Raab, Randy H. Katz. 28-43 [doi]
- The Implications of Diverse Applications and Scalable Data Sets in Benchmarking Big Data SystemsZhen Jia, Runlin Zhou, Chunge Zhu, Lei Wang, Wanling Gao, Yingjie Shi, Jianfeng Zhan, Lixin Zhang. 44-59 [doi]
- Processing Big Events with Showers and StreamsChristoph Doblander, Tilmann Rabl, Hans-Arno Jacobsen. 60-71 [doi]
- Big Data Provenance: Challenges and Implications for BenchmarkingBoris Glavic. 72-80 [doi]
- Benchmarking Spatial Big DataShashi Shekhar, Michael R. Evans, Viswanath Gunturi, KwangSoo Yang, Daniel Cintra Cugler. 81-93 [doi]
- Towards a Systematic Benchmark for Array Database SystemsPeter Baumann, Heinrich Stamerjohanns. 94-102 [doi]
- Unleashing Semantics of Research DataFlorian Stegmaier, Christin Seifert, Roman Kern, Patrick Höfler, Sebastian Bayerl, Michael Granitzer, Harald Kosch, Stefanie N. Lindstaedt, Belgin Mutlu, Vedran Sabol, Kai Schlegel, Stefan Zwicklbauer. 103-112 [doi]
- Generating Large-Scale Heterogeneous Graphs for BenchmarkingAmarnath Gupta. 113-128 [doi]
- A Micro-benchmark Suite for Evaluating HDFS Operations on Modern ClustersNusrat Sharmin Islam, Xiaoyi Lu, Md. Wasi-ur-Rahman, Jithin Jose, Dhabaleswar K. Panda. 129-147 [doi]
- Assessing the Performance Impact of High-Speed Interconnects on MapReduceYandong Wang, Yizheng Jiao, Cong Xu, Xiaobing Li, Teng Wang, Xinyu Que, Cristian Cira, Bin Wang, Zhuo Liu, Bliss Bailey, Weikuan Yu. 148-163 [doi]
- BigBench Specification V0.1 - BigBench: An Industry Standard Benchmark for Big Data AnalyticsTilmann Rabl, Ahmad Ghazal, Minqing Hu, Alain Crolotte, Francois Raab, Meikel Poess, Hans-Arno Jacobsen. 164-201 [doi]