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Defect aware X-filling for low-power scan testing

S. Balatsouka, V. Tenentes, Xrysovalantis Kavousianos, Krishnendu Chakrabarty. Defect aware X-filling for low-power scan testing. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 873-878, IEEE, 2010. [doi]

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