Kai Chen, Fan Jiang, Chuan-dong Huang. A new method of generating synchronizable test sequences that detect output-shifting faults based on multiple UIO sequences. In Hisham Haddad, editor, Proceedings of the 2006 ACM Symposium on Applied Computing (SAC), Dijon, France, April 23-27, 2006. pages 1791-1797, ACM, 2006. [doi]
Abstract is missing.