T. Cilento, M. Schenkel, C. Yun, R. Mishra, Junjun Li, Kiran V. Chatty, Robert Gauthier. Simulation of ESD protection devices in an advanced CMOS technology using a TCAD workbench based on an ESD calibration methodology. Microelectronics Reliability, 50(9-11):1367-1372, 2010. [doi]
@article{CilentoSYMLCG10,
title = {Simulation of ESD protection devices in an advanced CMOS technology using a TCAD workbench based on an ESD calibration methodology},
author = {T. Cilento and M. Schenkel and C. Yun and R. Mishra and Junjun Li and Kiran V. Chatty and Robert Gauthier},
year = {2010},
doi = {10.1016/j.microrel.2010.07.132},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.132},
tags = {workbench, C++},
researchr = {https://researchr.org/publication/CilentoSYMLCG10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1367-1372},
}