A 130 nm Event-Driven Voltage and Temperature Insensitive Capacitive ROC

Alessia Damilano, Marco Crepaldi, Paolo Motto Ros, Danilo Demarchi. A 130 nm Event-Driven Voltage and Temperature Insensitive Capacitive ROC. In 17th Euromicro Conference on Digital System Design, DSD 2014, Verona, Italy, August 27-29, 2014. pages 663-666, IEEE, 2014. [doi]

Abstract

Abstract is missing.