Wen-Wen Hsieh, I-Sheng Lin, TingTing Hwang. A physical-location-aware X-filling method for IR-drop reduction in at-speed scan test. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 1234-1237, IEEE, 2009. [doi]
Abstract is missing.