Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme

Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzler, Richard Antley, Craig Force. Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme. J. Electronic Testing, 27(3):241-252, 2011. [doi]

Abstract

Abstract is missing.