Hitesh Sajnani, Vaibhav Saini, Cristina Videira Lopes. A Comparative Study of Bug Patterns in Java Cloned and Non-cloned Code. In 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014, Victoria, BC, Canada, September 28-29, 2014. pages 21-30, IEEE, 2014. [doi]
Abstract is missing.