Divyanshu Vats, Andrew S. Lan, Christoph Studer, Richard G. Baraniuk. Optimal ranking of test items using the Rasch model. In 54th Annual Allerton Conference on Communication, Control, and Computing, Allerton 2016, Monticello, IL, USA, September 27-30, 2016. pages 467-473, IEEE, 2016. [doi]
Abstract is missing.