Pascal Witte, John G. Kauffman, Timon Brückner, Joachim Becker, Maurits Ortmanns. An error estimation technique for lowpass and bandpass ΣΔ ADC feedback DACs using a residual test signal. In 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012. pages 73-76, IEEE, 2012. [doi]
Abstract is missing.