Bin Zhou, Yizheng Ye, Yong-sheng Wang. Simultaneous reduction in test data volume and test time for TRC-reseeding. In Hai Zhou, Enrico Macii, Zhiyuan Yan, Yehia Massoud, editors, Proceedings of the 17th ACM Great Lakes Symposium on VLSI 2007, Stresa, Lago Maggiore, Italy, March 11-13, 2007. pages 49-54, ACM, 2007. [doi]
Abstract is missing.