A. G. O Neill - researchr alias

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Viewing Publication 1 - 2 from 2

2003

Direct measurement of residual stress in integrated circuit interconnect featuresA. B. Horsfall, J. M. M. dos Santos, S. M. Soare, N. G. Wright, A. G. O Neill, S. J. Bull, A. J. Walton, A. M. Gundlach, J. T. M. Stevenson. mr, 43(9-11):1797-1801, 2003. [doi]

2001

SiGe HMOSFET differential pairKostis Michelakis, S. Despotopoulos, S. G. Badcock, Christos Papavassiliou, A. G. O Neill, Chris Toumazou. iscas 2001: 679-682 [doi]

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