Amiya R. Nayak - researchr alias

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Viewing Publication 1 - 4 from 4

1998

Characterization of Catastrophic Faults in Reconfigurable Systolic ArraysVincenzo Acciaro, Amiya R. Nayak. vlsi, 1998(2):143-150, 1998. [doi]

Syndrome Signature in Output Compaction for VLSI Built-in Self-TestSunil R. Das, Nita Goel, Wen-Ben Jone, Amiya R. Nayak. vlsi, 1998(2):191-201, 1998. [doi]

Space compaction under generalized mergeabilitySunil R. Das, Emil M. Petriu, Tony F. Barakat, Mansour H. Assaf, Amiya R. Nayak. tim, 47(5):1283-1293, 1998. [doi]

1995

On testing of sequential machines using circuit decomposition and stochastic modelingSunil R. Das, Wen-Ben Jone, Amiya R. Nayak, Ian Choi. tsmc, 25(3):489-504, 1995. [doi]

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