On testing of sequential machines using circuit decomposition and stochastic modeling

Sunil R. Das, Wen-Ben Jone, Amiya R. Nayak, Ian Choi. On testing of sequential machines using circuit decomposition and stochastic modeling. IEEE Transactions on Systems, Man, and Cybernetics, Part A, 25(3):489-504, 1995. [doi]

Abstract

Abstract is missing.