Sunil R. Das, Wen-Ben Jone, Amiya R. Nayak, Ian Choi. On testing of sequential machines using circuit decomposition and stochastic modeling. IEEE Transactions on Systems, Man, and Cybernetics, Part A, 25(3):489-504, 1995. [doi]
@article{DasJNC95,
title = {On testing of sequential machines using circuit decomposition and stochastic modeling},
author = {Sunil R. Das and Wen-Ben Jone and Amiya R. Nayak and Ian Choi},
year = {1995},
doi = {10.1109/21.364861},
url = {http://dx.doi.org/10.1109/21.364861},
researchr = {https://researchr.org/publication/DasJNC95},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Systems, Man, and Cybernetics, Part A},
volume = {25},
number = {3},
pages = {489-504},
}