S. G. From - researchr alias

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Viewing Publication 1 - 2 from 2

1993

A beta model for estimating the testability and coverage distributions of a VLSI circuitH. A. Farhat, S. G. From. tcad, 12(4):550-554, 1993. [doi]

1992

A quadratic programming approach to estimating the testability and coverage distributions of a VLSI circuitH. A. Farhat, S. G. From, Antonio Lioy. jsa, 35(1-5):479-483, 1992. [doi]

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