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A. Giuliano Mirabella
Alberto Martin-Lopez
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Andrei Mancu
Angelo Gargantini
Antonio Ruiz Cortés
Arie van Deursen
Arumoy Shome
Baldoino Fonseca
Benjamin Steenhoek
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Paolo Arcaini
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Viewing Publication 1 - 25 from 25
2025
IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest@ICSE 2025, Ottawa, ON, Canada, May 3, 2025
IEEE,
2025.
[doi]
OpenCat: Improving Interoperability of ADS Testing
Qurban Ali
,
Andrea Stocco 0001
,
Leonardo Mariani
,
Oliviero Riganelli
.
icse-deeptest 2025
:
53-60
[doi]
DILLEMA: Diffusion and Large Language Models for Multi-Modal Augmentation
Luciano Baresi
,
Davide Yi Xian Hu
,
Muhammad Irfan Mas'udi
,
Giovanni Quattrocchi
.
icse-deeptest 2025
:
29-36
[doi]
Lachesis: Predicting LLM Inference Accuracy using Structural Properties of Reasoning Paths
Naryeong Kim
,
Sungmin Kang
,
Gabin An
,
Shin Yoo
.
icse-deeptest 2025
:
17-20
[doi]
DANDI: Diffusion as Normative Distribution for Deep Neural Network Input
Somin Kim
,
Shin Yoo
.
icse-deeptest 2025
:
9-16
[doi]
Robust Testing for Deep Learning using Human Label Noise
Gordon Lim
,
Stefan Larson
,
Kevin Leach
.
icse-deeptest 2025
:
21-28
[doi]
On the Effectiveness of LLMs for Manual Test Verifications
Myron David Lucena Campos Peixoto
,
Davy de Medeiros Baia
,
Nathalia Nascimento 0001
,
Paulo Alencar 0001
,
Baldoino Fonseca
,
Márcio Ribeiro 0001
.
icse-deeptest 2025
:
45-52
[doi]
Improving the Reliability of Failure Prediction Models through Concept Drift Monitoring
Lorena Poenaru-Olaru
,
Luis Cruz 0002
,
Jan S. Rellermeyer
,
Arie van Deursen
.
icse-deeptest 2025
:
1-8
[doi]
Reinforcement Learning from Automatic Feedback for High-Quality Unit Test Generation
Benjamin Steenhoek
,
Michele Tufano
,
Neel Sundaresan
,
Alexey Svyatkovskiy
.
icse-deeptest 2025
:
37-44
[doi]
2024
Proceedings of the 5th IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest 2024, Lisbon, Portugal, 20 April 2024
ACM,
2024.
[doi]
Federated Repair of Deep Neural Networks
Davide Li Calsi
,
Thomas Laurent 0003
,
Paolo Arcaini
,
Fuyuki Ishikawa
.
icse-deeptest 2024
:
[doi]
A Framework for Including Uncertainty in Robustness Evaluation of Bayesian Neural Network Classifiers
Wasim Essbai
,
Andrea Bombarda
,
Silvia Bonfanti
,
Angelo Gargantini
.
icse-deeptest 2024
:
[doi]
More is Not Always Better: Exploring Early Repair of DNNs
Andrei Mancu
,
Thomas Laurent 0003
,
Franz Rieger
,
Paolo Arcaini
,
Fuyuki Ishikawa
,
Daniel Rueckert
.
icse-deeptest 2024
:
[doi]
Data vs. Model Machine Learning Fairness Testing: An Empirical Study
Arumoy Shome
,
Luis Cruz 0002
,
Arie van Deursen
.
icse-deeptest 2024
:
[doi]
Guiding the Search Towards Failure-Inducing Test Inputs Using Support Vector Machines
Lev Sorokin
,
Niklas Kerscher
.
icse-deeptest 2024
:
[doi]
2023
IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest@ICSE 2023, Melbourne, Australia, May 15, 2023
IEEE,
2023.
[doi]
DeepPatch: A Patching-Based Method for Repairing Deep Neural Networks
Hao Bu
,
Meng Sun
.
icse-deeptest 2023
:
25-32
[doi]
Metamorphic Testing of Machine Translation Models using Back Translation
Wentao Gao
,
Jiayuan He 0002
,
Van-Thuan Pham
.
icse-deeptest 2023
:
1-8
[doi]
DeepSHAP Summary for Adversarial Example Detection
Yi-Ching Lin
,
Fang Yu
.
icse-deeptest 2023
:
17-24
[doi]
A Method of Identifying Causes of Prediction Errors to Accelerate MLOps
Keita Sakuma
,
Ryuta Matsuno
,
Yoshio Kameda
.
icse-deeptest 2023
:
9-16
[doi]
2021
3rd IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest@ICSE 2021, Madrid, Spain, June 1, 2021
IEEE,
2021.
[doi]
Machine Learning Model Drift Detection Via Weak Data Slices
Samuel Ackerman
,
Parijat Dube
,
Eitan Farchi
,
Orna Raz
,
Marcel Zalmanovici
.
icse-deeptest 2021
:
1-8
[doi]
Deep Learning-Based Prediction of Test Input Validity for RESTful APIs
A. Giuliano Mirabella
,
Alberto Martin-Lopez
,
Sergio Segura
,
Luis Valencia-Cabrera
,
Antonio Ruiz Cortés
.
icse-deeptest 2021
:
9-16
[doi]
TF-DM: Tool for Studying ML Model Resilience to Data Faults
Niranjhana Narayanan
,
Karthik Pattabiraman
.
icse-deeptest 2021
:
25-28
[doi]
A Review and Refinement of Surprise Adequacy
Michael Weiss
,
Rwiddhi Chakraborty
,
Paolo Tonella
.
icse-deeptest 2021
:
17-24
[doi]
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