Journal: IEEE Computer

Volume 13, Issue 3

6 -- 7Dhiraj K. Pradhan. Fault-Tolerant Computing
9 -- 15Sheldon B. Akers. Test Generation Techniques
17 -- 26John P. Hayes, Edward J. McCluskey. Testability Considerotions in Microprocessor-Based Design
27 -- 37Dhiraj K. Pradhan, Jack J. Stiffler. Error-Correcting Codes and Self-Checking Circuits
39 -- 45Albert L. Hopkins Jr.. Fault-Toleront System Design: Broad Brush and Fine Print
47 -- 53Arthur D. Friedman, Luca Simoncini. System-Level Fault Diagnosis
55 -- 65David A. Rennels. Distributed Fault-Tolerant Computer Systems
67 -- 73Carlo H. Séquin. Special Feature: Instruction in MOS LSI Systems Design
75 -- 77S. M. Neville. Workshop Report: Computer Elements Committee Discusses Micros and Minis