Journal: IEEE Design & Test of Computers

Volume 31, Issue 3

4 -- 5André Ivanov. The Internet of Things
6 -- 7Martin Dimitrov, Yung-Hsiang Lu, Chia-Lin Yang. Guest Editors' Introduction: Cloud Computing for Embedded Systems
8 -- 20Edward A. Lee, Björn Hartmann, John Kubiatowicz, Tajana Simunic Rosing, John Wawrzynek, David Wessel, Jan M. Rabaey, Kris Pister, Alberto L. Sangiovanni-Vincentelli, Sanjit A. Seshia, David Blaauw, Prabal Dutta, Kevin Fu, Carlos Guestrin, Ben Taskar, Roozbeh Jafari, Douglas L. Jones, Vijay Kumar, Rahul Mangharam, George J. Pappas, Richard M. Murray, Anthony Rowe. The Swarm at the Edge of the Cloud
21 -- 31Chengjia Huo, Ting-Chou Chien, Pai H. Chou. Middleware for IoT-Cloud Integration Across Application Domains
32 -- 40YoungHoon Jung, Michele Petracca, Luca P. Carloni. Cloud-Aided Design for Distributed Embedded Systems
42 -- 53Michael Linder, Alfred Eder, Ulf Schlichtmann, Klaus Oberländer. An Analysis of Industrial SRAM Test Results - A Comprehensive Study on Effectiveness and Classification of March Test Algorithms
54 -- 64Turbo Majumder, Partha Pratim Pande, Ananth Kalyanaraman. Wireless NoC Platforms With Dynamic Task Allocation for Maximum Likelihood Phylogeny Reconstruction
65 -- 75Fangming Ye, Krishnendu Chakrabarty, Zhaobo Zhang, Xinli Gu. Information-Theoretic Framework for Evaluating and Guiding Board-Level Functional-Fault Diagnosis
76 -- 84Xue Lin, Yanzhi Wang, Massoud Pedram, Jaemin Kim, Naehyuck Chang. Designing Fault-Tolerant Photovoltaic Systems
91 -- 92Theo Theocharides. Test Technology TC Newsletter
95 -- 96Scott Davidson. Hey, you, get onna my cloud [The Last Byte]