Journal: IEEE Design & Test of Computers

Volume 31, Issue 4

6 -- 15Fang Gong, Hao Yu, Yiyu Shi, Lei He. Variability-Aware Parametric Yield Estimation for Analog/Mixed-Signal Circuits: Concepts, Algorithms, and Challenges
16 -- 26Chun-Chuan Chi, Bing-Yang Lin, Cheng-Wen Wu, Min-Jer Wang, Hung-Chih Lin, Ching-Nen Peng. On Improving Interconnect Defect Diagnosis Resolution and Yield for Interposer-Based 3-D ICs
27 -- 35Srikar Bhagavatula, Byunghoo Jung, Yung-Hsiang Lu. Real-Time Power Sensors for Intelligent Power Management and Beyond
36 -- 42Shi-Yu Huang, Li-Ren Huang. PLL-Assisted Timing Circuit for Accurate TSV Leakage Binning
43 -- 50Satish G. Kandlikar. Design Considerations for Cooling High Heat Flux IC Chips With Microchannels