Journal: IBM Journal of Research and Development

Volume 49, Issue 1

1 -- 2. Editor s Note
3 -- 18Phillipe M. Vereecken, Robert A. Binstead, Hariklia Deligianni, Panayotis C. Andricacos. The chemistry of additives in damascene copper plating
19 -- 36Thomas P. Moffat, Daniel Wheeler, Monica D. Edelstein, Daniel Josell. Superconformal film growth: Mechanism and quantification
37 -- 48Alan C. West, Hariklia Deligianni, Panayotis C. Andricacos. Electrochemical planarization of interconnect metallization
49 -- 64Timothy O. Drews, Sriram Krishnan, Jay Alameda, Dennis Gannon, Richard D. Braatz, Richard C. Alkire. Multiscale simulations of copper electrodeposition onto a resistive substrate
65 -- 78Thomas L. Ritzdorf, Gregory J. Wilson, Paul R. McHugh, Daniel J. Woodruff, Kyle M. Hanson, Dakin Fulton. Design and modeling of equipment used in electrochemical processes for microelectronics
79 -- 102Li Sun, Yaowu Hao, Chia-Ling Chien, Peter C. Searson. Tuning the properties of magnetic nanowires
103 -- 126Emanuel I. Cooper, Christian Bonhôte, Jürgen Heidmann, Yimin Hsu, Philippe Kern, John W. Lam, Murali Ramasubramanian, Neil Robertson, Lubomyr T. Romankiw, Hong Xu. Recent developments in high-moment electroplated materials for recording heads
127 -- 144Philip G. Emma, Allan Hartstein, Thomas R. Puzak, Viji Srinivasan. Exploring the limits of prefetching
145 -- 166Richard E. Matick, Stanley Schuster. Logic-based eDRAM: Origins and rationale for use
167 -- 188Taqi N. Buti, Robert G. McDonald, Zakaria Khwaja, Asit Ambekar, Hung Q. Le, William E. Burky, Bert Williams. Organization and implementation of the register-renaming mapper for out-of-order IBM POWER4 processors