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    Journal: IBM Journal of Research and Development

    Volume 6, Issue 4

    394 -- 406Simon Middelhoek. Static Reversal Processes in Thin Ni-Fe Films
    407 -- 418Paul E. Boudreau, John S. Griffin Jr., Mark Kac. A Discrete Queueing Problem with Variable Service Times
    419 -- 429Hsu Chang. Analysis of Static and Quasidynamic Behavior of Magnetostatically Coupled Thin Magnetic Films
    430 -- 436Shmuel Winograd. Coding for Logical Operations
    437 -- 448John Wesley Horton. Experimental Study of Electron-Beam Driven Semiconductor Devices for Use in a Digital Memory
    449 -- 455James F. Freedman. Residual Stress in Single-Crystal Nickel Films
    456 -- 461Herbert B. Bebb. A Polarimetric Method of Measuring Magneto-Optic Coefficients
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