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    Journal: IEEE Instrum. Meas. Mag.

    Volume 20, Issue 6

    2 -- 0Wendy Van Moer. I&M in Industry [Editorial]
    3 -- 0Simone Corbellini. The pervasive role of measurements in the industrial world [Guest Editorial]
    8 -- 15Pasquale Daponte, Luca De Vito, Francesco Lamonaca, Francesco Picariello, Maria Riccio, Sergio Rapuano, Luca Pompetti, Mauro Pompetti. DronesBench: an innovative bench to test drones
    16 -- 21Luciana Bonino, Stefano Cesare, Luca Massotti, Sergio Mottini, Kolja Nicklaus, Marco Pisani, Pierluigi Silvestrin. Laser metrology for next generation gravity mission
    22 -- 29Annarita Lazzari, Jean-Michel Pou, Christopher DuBois, Laurent Leblond. Smart metrology: the importance of metrology of decisions in the big data era
    28 -- 29Stefano Rinaldi. The role of measurement in smart cities pilot projects [Future I&M]
    30 -- 55Dimosthenis E. Bolanakis. MEMS barometers and barometric altimeters in industrial, medical, aerospace, and consumer applications
    39 -- 44Luciane Agnoletti Dos Santos Pedotti, Ricardo Mazza Zago, Fabiano Fruett. Fault diagnostics in rotary machines through spectral vibration analysis using low-cost MEMS devices
    45 -- 48Jackie Ferguson, Chris Burns. Yardsticks of science: the origins and future of the international unit
    49 -- 55Fouzi Harrou, Nabil Zerrouki, Ying Sun 0002, Amrane Houacine. Vision-based fall detection system for improving safety of elderly people
    56 -- 60Jie Wu, Bing Nan Li. Development of a magnetoinductive lens for magnetic resonance imaging
    61 -- 66J. Max Cortner. By the Numbers! [Life After Graduation]
    62 -- 66Sergio Rapuano. Chapter chair summit 2017 [Society News]
    67 -- 71Robert Goldberg. New products

    Volume 20, Issue 5

    2 -- 0Wendy Van Moer. Big data in I&M [Editorial]
    3 -- 0Dario Petri. Big Data in Instrumentation and Measurement [Guest Editorial]
    4 -- 20Luca Mari, Dario Petri. The metrological culture in the context of big data: managing data-driven decision confidence
    10 -- 29Jean-Michel Pou. The Metrologist's place is by the machines!
    13 -- 20Francesco Mari, Paolo Masini. Big data at work: the practitioners' point of view
    21 -- 22Irina Florea. Future trends in security for Instrumentation and Measurement [Trends in Future I&M]
    23 -- 26Veronica Scotti. Big data or big (privacy) problem?
    27 -- 29Richard Davis. The story of Invar [Basice Metrology]
    30 -- 34Franco Baroncini, Simona Salicone. How synchronization evolved from analog to digital in the TLC world
    35 -- 38Sayantan Sinha. Implementation of an 8-bit ADC using successive subtraction technique
    39 -- 45Oluyemi Omomukuyo, Octavia A. Dobre, Ramachandran Venkatesan, Telex Magloire Nkouatchah Ngatched. Bandwidth-efficient synchronization for fiber optic transmission: system performance measurements
    46 -- 55Wendy Meulebroeck, Hugo Thienpont, Heidi Ottevaere. Photonics enhanced sensors for food monitoring: Part 3
    59 -- 63Robert Goldberg. New products

    Volume 20, Issue 4

    2 -- 0Ruth A. Dyer, Teresa Pace. Welcome to IEEE AUTOTESTCON 2017 [President's Message]
    3 -- 10Tarek K. Helaly, Nikhil V. Adnani. A fourth category of software-defined instrumentation for wireless test
    11 -- 20Peter Lindahl, Greg Bredariol, John S. Donnal, Steven B. Leeb. Noncontact electrical system monitoring on a U.S. Coast Guard cutter
    21 -- 22George Cornea. A young perspective of power systems measurement and protection [Trends in Future I&M]
    23 -- 30Igor Aleksejev, Artur Jutman, Sergei Devadze. Run-time reconfigurable instruments for advanced board-level testing
    31 -- 33Richard Davis. Reinventing the Wheel [Basic Metrology]
    34 -- 44Zhiping Liu, Ge Lu, Xingle Liu, Xiaoli Jiang, Gabriël Lodewijks. Image processing algorithms for crack detection in welded structures via pulsed eddy current thermal imaging
    45 -- 48Niclas Björsell, Wendy Van Moer. Measuring and characterizing nonlinear RF systems
    49 -- 54Rodrigo Wolff Porto, Valner Joao Brusamarello, Ivan Müller, Fabian Leonardo Cabrera Riaño, Fernando Rangel de Sousa. Wireless power transfer for contactless instrumentation and measurement
    55 -- 56Katelyn Brinker. NASA space technology research fellowship award [Society News]
    60 -- 64Robert Goldberg. New products

    Volume 20, Issue 3

    2 -- 0Wendy Van Moer. I&M for farmers [Editorial]
    2 -- 3Samir Trabelsi. New Technologies in Agriculture [Guest Editorial]
    4 -- 12Aaron Patrick, Sara Pelham, Albert Culbreath, C. Corely Holbrook, Ignácio José De Godoy, Changying Li. High throughput phenotyping of tomato spot wilt disease in peanuts using unmanned aerial systems and multispectral imaging
    13 -- 42Richard Davis, Oon-Doo Baik, Shahab Sokhansanj. How to measure a lobster or size an egg [Basicmetrology]
    15 -- 19Richard A. Speir, Mark A. Haidekker. Onion postharvest quality assessment with x-ray computed tomography - A pilot study
    20 -- 24Dominique Henry, Hervé Aubert, Thierry Veronese, Eric Serrano. Remote estimation of intra-parcel grape quantity from three-dimensional imagery technique using ground-based microwave FMCW radar
    25 -- 42Markos Asprou. Synchronized measurement technology: A blessing for power systems [Trends in Future I&M]
    26 -- 31Andrea Cataldo, Egidio De Benedetto, Christof Huebner, Dennis Trebbels. TDR application for moisture content estimation in agri-food materials
    32 -- 55Chandra B. Singh, John M. Fielke. Recent developments in stored grain sensors, monitoring and management technology
    37 -- 42Bijay L. Shrestha, Hugh C. Wood, Lope Tabil, Oon-Doo Baik, Shahab Sokhansanj. Microwave permittivity-assisted artificial neural networks for determining moisture content of chopped alfalfa forage
    43 -- 49Domenico Luca Carnì, Domenico Grimaldi, Alfonso Nastro, Vitaliano Spagnuolo, Francesco Lamonaca. Blood oxygenation measurement by smartphone
    50 -- 54Robert Goldberg. New products

    Volume 20, Issue 2

    2 -- 3Jorge Daher. Highlighting Latin American authors [Guest Editorial]
    2 -- 0Wendy Van Moer. I&M around the World [Editorial]
    4 -- 10John Soldera, Guilherme Schu, Lucas Royes Schardosim, Eric Tadiello Beltrao. Facial biometrics and applications
    11 -- 12Jean-Michel Pou. A smart approach to calibration - why we should forget calendar-based calibrations
    13 -- 19Hugo Cesar Rocha Liborio Tenorio, Debora Albuquerque Vieira, Cleonilson Protásio de Souza. Measurement of parameters and degradation of thermoelectric modules
    20 -- 0J. Max Cortner. Mission critical [Life After Graduation]
    21 -- 30Guilherme Bertelli, Anderson Santos, Ivanovitch Silva, Renato Fernandes, Dennis Brandao, Ivan Müller, João Cesar Netto, Jean Michel Winter, Carlos Eduardo Pereira. Research activities on industrial wireless instrumentation: Brazilian perspective
    31 -- 32Virginica Dinut. Biofeedback in Psychotherapy [Trends in Future I&M]
    33 -- 38Germán Álvarez-Botero, Fabián E. Baron, C. Camilo Cano, Oscar Sosa, Margarita Varon. Optical sensing using fiber bragg gratings: fundamentals and applications
    39 -- 42Richard Davis. From telegraphy to the revised SI [Basic Metrology]
    43 -- 50Joao A. F. Ferreira, Antonio Petraglia. Analog integrated lock-in amplifier for optical sensors
    43 -- 50Joao A. F. Ferreira, Antonio Petraglia. Analog integrated lock-in amplifier for optical sensors
    51 -- 56Rodrigo H. Murofushi, Jose J. P. Z. S. Tavares. Towards fourth industrial revolution impact: smart product based on RFID technology
    63 -- 67Robert Goldberg. New products

    Volume 20, Issue 1

    2 -- 0Wendy Van Moer. Welcome 2017 [Editorial]
    3 -- 0Veronica Scotti. Profiling: A promising field for metrologists [Guest Editorial]
    4 -- 7Alessandro Ferrero. DNA profiling: A metrological and signal processing perspective
    8 -- 10Richard Davis. Science and Precision Measurement
    11 -- 14Charles Georget, Aime Conigliaro. A perspective on bitemark analysis: from empiricism to scientific rationality
    15 -- 19Henry Swofford, Ted Vosk. Metrology applied to forensic pattern evidence domains - A call for more forensic science metrology principles
    20 -- 28Pasquale Daponte, Luca De Vito, Sergio Rapuano, Ioan Tudosa. Analog-to-information converters in the wideband rf measurement for aerospace applications: current situation and perspectives
    29 -- 30Irina Florea. Merging theoretical concepts with practice
    31 -- 37Wendy Meulebroeck, Hugo Thienpont, Heidi Ottevaere. Photonics enhanced sensors for food monitoring: part 2
    38 -- 48Octavian Adrian Postolache, Gabriela Postolache. Development and selection of balance sensing devices
    49 -- 54Robert Goldberg. New Products
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