Journal: IEEE Transactions on Computers

Volume 51, Issue 5

449 -- 459Vikram Iyengar, Krishnendu Chakrabarty. Test Bus Sizing for System-on-a-Chip
460 -- 473Said Hamdioui, A. J. van de Goor. Efficient Tests for Realistic Faults in Dual-Port SRAMs
474 -- 485Shin-ichi Minato. Streaming BDD Manipulation
486 -- 497Takahiro J. Yamaguchi, Dong Sam Ha, Masahiro Ishida, Tadahiro Ohmi. A Method for Compressing Test Data Based on Burrows-Wheeler Transformation
498 -- 510Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey. A Design Diversity Metric and Analysis of Redundant Systems
511 -- 520Arash Reyhani-Masoleh, M. Anwarul Hasan. A New Construction of Massey-Omura Parallel Multiplier over ::::GF::::(2:::::::m:::::::)
521 -- 529Huapeng Wu. Montgomery Multiplier and Squarer for a Class of Finite Fields
530 -- 540Jianer Chen, Guojun Wang, Songqiao Chen. Locally Subcube-Connected Hypercube Networks: Theoretical Analysis and Experimental Results
541 -- 552Thomas S. Messerges, Ezzy A. Dabbish, Robert H. Sloan. Examining Smart-Card Security under the Threat of Power Analysis Attacks
553 -- 560Li Zhang 0001. Fault-Tolerant Meshes with Small Degree
561 -- 580Wei Chen, Sam Toueg, Marcos Kawazoe Aguilera. On the Quality of Service of Failure Detectors
581 -- 588Chor Ping Low, Xueyan Song. On Finding Feasible Solutions for the Delay Constrained Group Multicast Routing Problem
588 -- 591Dieter Gollmann. Equally Spaced Polynomials, Dual Bases, and Multiplication in F::2:::n:::::